DeviceSpace.com
Medical Device and Diagnostics
News & Jobs
 
Search the Site
    
 
Biotechnology and Pharmaceutical Channel Medical Device and Diagnostics Channel Clinical Research Channel BioSpace Collaborative    Job Seekers:  Register | Login           Employers:  Register | Login  

 News | News By Subject | News By Date | Search News
Get Our Industry eNewsletter FREE email:    
 Print  Email    

Advanced Genetic Tests Spot More Defects Before Birth, New England Journal of Medicine Reveals


12/6/2012 8:14:31 AM

Birth defects can be spotted more precisely with advanced genetic tests that are performed on a fetus than with current prenatal tests, and may help pinpoint abnormalities that cause stillbirths, researchers said. Two studies published yesterday in the New England Journal of Medicine suggest the tests called chromosomal microarrays could become standard for women with high-risk pregnancies. They may eventually be offered to all pregnant women, said Ronald Wapner, vice chairman of research at Columbia University Medical Center’s department of obstetrics and gynecology in New York.

Read at Bloomberg
Read at Business Week

 Read Article at  Related Companies  News Categories
 
 


ADD TO DEL.ICIO.US    ADD TO DIGG    ADD TO FURL    ADD TO STUMBLEUPON    ADD TO TECHNORATI FAVORITES
 
    

//-->